Articles | Volume 35, issue 6
https://doi.org/10.5194/ejm-35-1079-2023
https://doi.org/10.5194/ejm-35-1079-2023
Research article
 | 
05 Dec 2023
Research article |  | 05 Dec 2023

Electron backscatter diffraction analysis combined with NanoSIMS U–Pb isotope data reveal intra-grain plastic deformation in zircon and its effects on U–Pb age: examples from Himalayan eclogites, Pakistan

Hafiz U. Rehman, Takanori Kagoshima, Naoto Takahata, Yuji Sano, Fabrice Barou, David Mainprice, and Hiroshi Yamamoto

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Short summary
Zircon preserves geologic rock history. Electron backscatter diffraction (EBSD) analysis is useful to visualize deformed domains in zircons. Zircons from the Himalayan high-pressure eclogites were analzyed for EBSD to identify intra-grain plastic deformation. The U–Pb isotope age dating, using Nano-SIMS, showed that plastic deformation likely affects the geochronological records. For geologically meaningful results, it is necessary to identify undisturbed domains in zircon via EBSD.